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Re: [PATCH v4 0/5] Series of fixes for PL011 char device
From: |
Peter Maydell |
Subject: |
Re: [PATCH v4 0/5] Series of fixes for PL011 char device |
Date: |
Thu, 2 Feb 2023 17:54:34 +0000 |
On Mon, 23 Jan 2023 at 16:23, Evgeny Iakovlev
<eiakovlev@linux.microsoft.com> wrote:
>
> v4:
> * Fixed post_load hook to be backwards-migratable
> * Refactored some code in 5/5 as per review comments
>
> v3:
> * Introduced a post_load hook for PL011State migration for
> backwards-compatibility due to some input state fragility.
> * No longer touching irq lines in reset method
> * Minor changes based on review feedback.
>
> v2:
> * Moved FIFO depth refactoring part of FIFO flags change into its own
> commit.
> * Added a reset method for PL011
Patch 5 in this series breaks "make check" for both the
boot-serial-test and the migration-test (both of which
have some simple code that writes to the serial port).
I suspect in both cases that the guest code is just not
bothering to set the UART control register correctly,
because it's never needed to do so in the past.
(This does make me wonder about the utility of making
this change -- it seems likely that we're going to break
naive bare-metal intended-to-work-on-QEMU code and not
really benefit any real-world runs-on-real-hardware
code, which is presumably just enabling TX and RX and
leaving it that way.)
I've taken patches 1-4 into target-arm.next.
thanks
-- PMM
- Re: [PATCH v4 0/5] Series of fixes for PL011 char device,
Peter Maydell <=