Re: [PATCH v3 7/7] hw/cxl/events: Add injection of Memory Module Events

[Ira Weiny]

Jonathan Cameron wrote:
> These events include a copy of the device health information at the
> time of the event. Actually using the emulated device health would
> require a lot of controls to manipulate that state.  Given the aim
> of this injection code is to just test the flows when events occur,
> inject the contents of the device health state as well.
> 
> Future work may add more sophisticate device health emulation
> including direct generation of these records when events occur
> (such as a temperature threshold being crossed).  That does not
> reduce the usefulness of this more basic generation of the events.

Seems very reasonable to me.

One spelling issue below.  With that.

Reviewed-by: Ira Weiny <ira.weiny@intel.com>

> 
> Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com>
> ---
>  hw/mem/cxl_type3.c          | 61 +++++++++++++++++++++++++++++++++++++
>  hw/mem/cxl_type3_stubs.c    | 12 ++++++++
>  include/hw/cxl/cxl_events.h | 19 ++++++++++++
>  qapi/cxl.json               | 35 +++++++++++++++++++++
>  4 files changed, 127 insertions(+)
> 

[...]

> diff --git a/qapi/cxl.json b/qapi/cxl.json
> index 32f340d972..8b3d30cd71 100644
> --- a/qapi/cxl.json
> +++ b/qapi/cxl.json
> @@ -90,6 +90,41 @@
>              '*column': 'uint16', '*correction-mask': [ 'uint64' ]
>             }}
>  
> +##
> +# @cxl-inject-memory-module-event:
> +#
> +# Inject an event record for a Memory Module Event (CXL r3.0 8.2.9.2.1.3)
> +# This event includes a copy of the Device Health info at the time of
> +# the event.
> +#
> +# @path: CXL type 3 device canonical QOM path
> +# @log: Event Log to add the event to
> +# @flags: header flags
> +# @type: Device Event Type (see spec for permitted values)
> +# @health-status: Overall health summary bitmap (see spec for permitted bits)
> +# @media-status: Overall media health summary (see spec for permitted values)
> +# @additional-status: Complex field (see spec for meaning)
> +# @life-used: Percentage (0-100) of factory expected life span
> +# @temperature: Device temperature in degrees Celsius
> +# @dirty-shutdown-count: Counter incremented whenever device is unable
> +#                        to determine if data loss may have occured.

                                                              ^^^^^^^^^
                                                              occurred

Ira