On Apr 15 15:26, Philippe Mathieu-Daudé wrote:
On 4/15/20 3:20 PM, Klaus Birkelund Jensen wrote:
I'll get the v1.3 series ready next.
Cool. What really matters (to me) is seeing tests. If we can merge tests
(without multiple namespaces) before the rest of your series, even better.
Tests give reviewers/maintainers confidence that code isn't breaking ;)
The patches that I contribute have been pretty extensively tested by
various means in a "host setting" (e.g. blktests and some internal
tools), which really exercise the device by doing heavy I/O, testing for
compliance and also just being mean to it (e.g. tripping bus mastering
while doing I/O).
Don't misunderstand me as trying to weasel my way out of writing tests,
but I just want to understand the scope of the tests that you are
looking for? I believe (hope!) that you are not asking me to implement a
user-space NVMe driver in the test, so I assume the tests should varify
more low level details?