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[Qemu-devel] [Bug 1798780] Re: hw/usb/dev-mtp.c:1616: bad test ?


From: Peter Maydell
Subject: [Qemu-devel] [Bug 1798780] Re: hw/usb/dev-mtp.c:1616: bad test ?
Date: Tue, 26 Mar 2019 16:55:56 -0000

Fixed by commit 49f9e8d660d4 which will be in QEMU 4.0.


** Changed in: qemu
       Status: New => Fix Committed

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https://bugs.launchpad.net/bugs/1798780

Title:
  hw/usb/dev-mtp.c:1616: bad test ?

Status in QEMU:
  Fix Committed

Bug description:
  hw/usb/dev-mtp.c:1616:52: warning: logical ‘or’ of collectively
  exhaustive tests is always true [-Wlogical-op]

  Source code is

                  if ((ret == -1) && (errno != EINTR || errno != EAGAIN ||
                                      errno != EWOULDBLOCK)) {

  Maybe better code

                  if ((ret == -1) && (errno != EINTR && errno != EAGAIN &&
                                      errno != EWOULDBLOCK)) {

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