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[Qemu-devel] [Bug 1798780] [NEW] hw/usb/dev-mtp.c:1616: bad test ?


From: dcb
Subject: [Qemu-devel] [Bug 1798780] [NEW] hw/usb/dev-mtp.c:1616: bad test ?
Date: Fri, 19 Oct 2018 09:07:40 -0000

Public bug reported:

hw/usb/dev-mtp.c:1616:52: warning: logical ‘or’ of collectively
exhaustive tests is always true [-Wlogical-op]

Source code is

                if ((ret == -1) && (errno != EINTR || errno != EAGAIN ||
                                    errno != EWOULDBLOCK)) {

Maybe better code

                if ((ret == -1) && (errno != EINTR && errno != EAGAIN &&
                                    errno != EWOULDBLOCK)) {

** Affects: qemu
     Importance: Undecided
         Status: New

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https://bugs.launchpad.net/bugs/1798780

Title:
  hw/usb/dev-mtp.c:1616: bad test ?

Status in QEMU:
  New

Bug description:
  hw/usb/dev-mtp.c:1616:52: warning: logical ‘or’ of collectively
  exhaustive tests is always true [-Wlogical-op]

  Source code is

                  if ((ret == -1) && (errno != EINTR || errno != EAGAIN ||
                                      errno != EWOULDBLOCK)) {

  Maybe better code

                  if ((ret == -1) && (errno != EINTR && errno != EAGAIN &&
                                      errno != EWOULDBLOCK)) {

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