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[Bug ld/23854] New: -no-pie -export-dynamic corrupts binary

From: stsp at users dot sourceforge.net
Subject: [Bug ld/23854] New: -no-pie -export-dynamic corrupts binary
Date: Sun, 04 Nov 2018 03:20:41 +0000


            Bug ID: 23854
           Summary: -no-pie -export-dynamic corrupts binary
           Product: binutils
           Version: 2.30
            Status: UNCONFIRMED
          Severity: critical
          Priority: P2
         Component: ld
          Assignee: unassigned at sourceware dot org
          Reporter: stsp at users dot sourceforge.net
  Target Milestone: ---

Created attachment 11375
  --> https://sourceware.org/bugzilla/attachment.cgi?id=11375&action=edit
test case

Out of sudden my prog started to randomly crash on i386 target.
It appears the combination of options -no-pie -export-dynamic
causes ld to randomly corrupt the code section.
Attached is the fully automated test-case.
Just type "make" - it will link the executable and look
with gdb at the assembler in one particular place where
I spotted the corruption. It will then print "TEST FAILED!".
You can run "make good" that will do the same but without
-export-dynamic. This will end up in "TEST PASSED!".

gold has no such problem.

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